[ { "key": "6JDA8E6Q", "version": 9, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/6JDA8E6Q", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/6JDA8E6Q", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Bagot et al.", "parsedDate": "2017-02-15", "numChildren": 2 }, "data": { "key": "6JDA8E6Q", "version": 9, "itemType": "journalArticle", "title": "An Atom Probe Tomography study of site preference and partitioning in a nickel-based superalloy", "creators": [ { "creatorType": "author", "firstName": "P. A. J.", "lastName": "Bagot" }, { "creatorType": "author", "firstName": "O. B. W.", "lastName": "Silk" }, { "creatorType": "author", "firstName": "J. O.", "lastName": "Douglas" }, { "creatorType": "author", "firstName": "S.", "lastName": "Pedrazzini" }, { "creatorType": "author", "firstName": "D. J.", "lastName": "Crudden" }, { "creatorType": "author", "firstName": "T. L.", "lastName": "Martin" }, { "creatorType": "author", "firstName": "M. C.", "lastName": "Hardy" }, { "creatorType": "author", "firstName": "M. P.", "lastName": "Moody" }, { "creatorType": "author", "firstName": "R. C.", "lastName": "Reed" } ], "abstractNote": "Atom Probe Tomography (APT) has been utilised for an in-depth examination of the commercial polycrystalline Ni-based superalloy RR1000, assessing compositions of the primary, secondary and tertiary γ′ phases. Clear differences in the phase chemistries are noted, particularly for the tertiary γ′ to which much of the alloy strength is attributed. Trace amounts of Hf are found to segregate strongly to the primary and secondary γ′ phases, but also exhibit an extended diffusion profile across the γ-γ′ interface up to 80 nm wide. Ti, Al and Mo demonstrate similar, yet not as pronounced diffusion profiles, indicating assumed phase chemistries may not be representative of those regions adjacent to the γ-γ′ interface. Within γ′, unique element site-occupancy preferences for this alloy were identified. Finally, the grain boundary chemistry across a γ-γ interface and that of an intragranular boride were analysed, identifying the latter as a mixed M5B3 boride rich in Mo and Cr. These demonstrate further the depth of information on Ni-alloys accessible by APT, while the overall implications of results in comparison with other in-service/model alloys are also discussed.", "publicationTitle": "Acta Materialia", "publisher": "", "place": "", "date": "February 15, 2017", "volume": "125", "issue": "", "section": "", "partNumber": "", "partTitle": "", "pages": "156-165", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "Acta Materialia", "DOI": "10.1016/j.actamat.2016.11.053", "citationKey": "", "url": "http://www.sciencedirect.com/science/article/pii/S135964541630920X", "accessDate": "2016-12-14T18:52:00Z", "PMID": "", "PMCID": "", "ISSN": "1359-6454", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "ScienceDirect", "callNumber": "", "rights": "", "extra": "", "tags": [ { "tag": "Aerospace materials", "type": 1 }, { "tag": "Atom probe tomography", "type": 1 }, { "tag": "Hafnium", "type": 1 }, { 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"type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/SFDT4Z4T", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/SFDT4Z4T", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Aboulfadl et al.", "parsedDate": "2016-11-21", "numChildren": 2 }, "data": { "key": "SFDT4Z4T", "version": 8, "itemType": "journalArticle", "title": "Atomic scale analysis of phase formation and diffusion kinetics in Ag/Al multilayer thin films", "creators": [ { "creatorType": "author", "firstName": "Hisham", "lastName": "Aboulfadl" }, { "creatorType": "author", "firstName": "Isabella", "lastName": "Gallino" }, { "creatorType": "author", "firstName": "Ralf", "lastName": "Busch" }, { "creatorType": "author", "firstName": "Frank", "lastName": "Mücklich" } ], "abstractNote": "Thin films generally exhibit unusual kinetics leading to chemical reactions far from equilibrium conditions. Binary metallic multilayer thin films with miscible elements show some similar behaviors with respect to interdiffusion and phase formation mechanisms. Interfacial density, lattice defects, internal stresses, layer morphologies and deposition conditions strongly control the mass transport between the individual layers. In the present work, Ag/Al multilayer thin films are used as a simple model system, in which the effects of the sputtering power and the bilayer period thickness on the interdiffusion and film reactions are investigated. Multilayers deposited by DC magnetron sputtering undergo calorimetric and microstructural analyses. In particular, atom probe tomography is extensively used to provide quantitative information on concentration gradients, grain boundary segregations, and reaction mechanisms. The magnitude of interdiffusion was found to be inversely proportional to the period thickness for the films deposited under the same conditions, and was reduced using low sputtering power. Both the local segregation at grain boundaries as well as pronounced non-equilibrium supersaturation effects play crucial roles during the early stages of the film reactions. For multilayers with small periods of 10 nm supersaturation of the Al layers with Ag precedes the polymorphic nucleation and growth of the hcp γ-Ag2Al phase. In larger periods the γ phase formation is triggered at junctions between grain boundaries and layers interfaces, where the pathway to heterogeneous nucleation is local supersaturation. Other Ag-rich phases also form as intermediate phases due to asymmetric diffusion rates of parent phases in the γ phase during annealing.", "publicationTitle": "Journal of Applied Physics", "publisher": "", "place": "", "date": "November 21, 2016", "volume": "120", "issue": "19", "section": "", "partNumber": "", "partTitle": "", "pages": "195306", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "Journal of Applied Physics", "DOI": "10.1063/1.4968013", "citationKey": "", "url": "http://aip.scitation.org/doi/full/10.1063/1.4968013", "accessDate": "2016-12-14T16:38:59Z", "PMID": "", "PMCID": "", "ISSN": "0021-8979", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "aip.scitation.org (Atypon)", "callNumber": "", "rights": "", "extra": "", "tags": [], "collections": [ "AFA27WGJ" ], "relations": {}, "dateAdded": "2016-12-14T16:38:59Z", "dateModified": "2016-12-14T16:38:59Z" } }, { "key": "7R9GVJJK", "version": 7, "library": { 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"username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Kim et al.", "numChildren": 2 }, "data": { "key": "MUQJBBQD", "version": 7, "itemType": "journalArticle", "title": "Atom-probe tomography of tribological boundary films resulting from boron-based oil additives", "creators": [ { "creatorType": "author", "firstName": "Yoon-Jun", "lastName": "Kim" }, { "creatorType": "author", "firstName": "Sung-Il", "lastName": "Baik" }, { "creatorType": "author", "firstName": "Leonardo", "lastName": "Bertolucci-Coelho" }, { "creatorType": "author", "firstName": "Luca", "lastName": "Mazzaferro" }, { "creatorType": "author", "firstName": "Giovanni", "lastName": "Ramirez" }, { "creatorType": "author", "firstName": "Ali", "lastName": "Erdermir" }, { "creatorType": "author", "firstName": "David N.", "lastName": "Seidman" } ], "abstractNote": "Correlative characterization using atom-probe tomography (APT) and transmission electron microscopy (TEM) was performed on a tribofilm formed during sliding frictional testing with a fully formulated engine oil, which also contains a boron-based additive. The tribofilm formed is ∼15 nm thick and consists of oxides of iron and compounds of B, Ca, P, and S, which are present in the additive. This study provides strong evidence for boron being embedded in the tribofilm, which effectively reduces friction and wear losses.", "publicationTitle": "Scripta Materialia", "publisher": "", "place": "", "date": "", "volume": "", "issue": "", "section": "", "partNumber": "", "partTitle": "", "pages": "", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "Scripta Materialia", "DOI": "10.1016/j.scriptamat.2015.08.015", "citationKey": "", "url": "http://www.sciencedirect.com/science/article/pii/S1359646215003619", "accessDate": "2015-09-21T18:09:18Z", "PMID": "", "PMCID": "", "ISSN": "1359-6462", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "ScienceDirect", "callNumber": "", "rights": "", "extra": "", "tags": [ { "tag": "Atom-probe tomography", "type": 1 }, { "tag": "Boron oxide", "type": 1 }, { "tag": "Lubricant", "type": 1 }, { "tag": "Transmission electron microscopy", "type": 1 }, { "tag": "Tribofilm", "type": 1 } ], "collections": [ "AFA27WGJ" ], "relations": {}, "dateAdded": "2015-09-21T18:09:18Z", "dateModified": "2015-09-21T18:09:18Z" } }, { "key": "X2AMC943", "version": 6, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/X2AMC943", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/X2AMC943", "type": "text/html" }, "up": { "href": "https://api.zotero.org/groups/11/items/VFP8JCQX", "type": "application/json" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } } }, "data": { "key": "X2AMC943", "version": 6, "parentItem": "VFP8JCQX", "itemType": "attachment", "linkMode": "linked_url", "title": "ScienceDirect Full Text PDF", "accessDate": "2015-09-21T18:07:48Z", "url": "http://www.sciencedirect.com/science/article/pii/S008087841500037X/pdfft?md5=192b0ee0d12dc33a69e3dc330b93ea17&pid=1-s2.0-S008087841500037X-main.pdf", "note": "", "contentType": "application/pdf", "charset": "", "tags": [], "relations": {}, "dateAdded": "2015-09-21T18:07:48Z", "dateModified": "2015-09-21T18:07:48Z" } }, { "key": "S5QFPJXR", "version": 6, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/S5QFPJXR", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/S5QFPJXR", "type": "text/html" }, "up": { "href": "https://api.zotero.org/groups/11/items/VFP8JCQX", "type": "application/json" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } } }, "data": { "key": "S5QFPJXR", "version": 6, "parentItem": "VFP8JCQX", "itemType": "attachment", "linkMode": "linked_url", "title": "ScienceDirect Snapshot", "accessDate": "2015-09-21T18:07:48Z", "url": "http://www.sciencedirect.com/science/article/pii/S008087841500037X", "note": "", "contentType": "text/html", "charset": "", "tags": [], "relations": {}, "dateAdded": "2015-09-21T18:07:48Z", "dateModified": "2015-09-21T18:07:48Z" } }, { "key": "VFP8JCQX", "version": 6, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/VFP8JCQX", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/VFP8JCQX", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Jeon and Lauhon", "numChildren": 2 }, "data": { "key": "VFP8JCQX", "version": 6, "itemType": "bookSection", "title": "Atom Probe Tomography of Nanowires", "creators": [ { "creatorType": "author", "firstName": "Nari", "lastName": "Jeon" }, { "creatorType": "author", "firstName": "Lincoln J.", "lastName": "Lauhon" }, { "creatorType": "editor", "firstName": "BT - Semiconductors and", "lastName": "Semimetals" } ], "abstractNote": "Atom probe tomography (APT) is a destructive material characterization technique that can analyze the composition of small volumes (~ 100 × 100 × 100 nm3) of a sample with subnanometer resolution and part per million sensitivity. APT is therefore well suited to investigate semiconductor nanostructures in order to relate growth conditions to nanoscale structure and nanostructure to physical properties. Furthermore, the geometry of semiconductor nanowires facilitates their analysis by APT. This chapter is intended for scientists and engineers who are interested in using APT to characterize semiconductor nanowires or for those who wish to assess research findings derived from APT more critically and with a greater understanding of the method. We first introduce the principles of APT to provide the basic background needed to understand the capabilities and limitations of the method, and then briefly review experimental considerations including sample preparation, operation conditions, and reconstruction guidelines. We then present examples of the atom probe analysis of semiconductor nanowires focused on important analytical challenges including dopants and impurities, alloy fluctuations and clusters, and heterointerfaces. Concurrently, we explain key challenges to sample preparation and analysis and suggest approaches to overcome or circumvent these challenges.", "bookTitle": "", "series": "", "seriesNumber": "", "volume": "", "numberOfVolumes": "", "edition": "", "date": "", "publisher": "Elsevier", "place": "", "originalDate": "", "originalPublisher": "", "originalPlace": "", "format": "", "pages": "", "ISBN": "", "DOI": "", "citationKey": "", "url": "http://www.sciencedirect.com/science/article/pii/S008087841500037X", "accessDate": "2015-09-21T18:07:48Z", "ISSN": "", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "ScienceDirect", "callNumber": "", "rights": "", "extra": "", "tags": [ { "tag": "Alloys", "type": 1 }, { "tag": "Atom probe tomography", "type": 1 }, { "tag": "Dopants", "type": 1 }, { "tag": "Heterostructures", "type": 1 }, { "tag": "Impurities", "type": 1 }, { "tag": "Interfaces", "type": 1 }, { "tag": "Semiconductor nanowires", "type": 1 } ], "collections": [ "AFA27WGJ" ], "relations": {}, "dateAdded": "2015-09-21T18:07:48Z", "dateModified": "2015-09-21T18:07:48Z" } }, { "key": "SAQNNDRG", "version": 5, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/SAQNNDRG", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/SAQNNDRG", "type": "text/html" }, "up": { "href": "https://api.zotero.org/groups/11/items/KFKKDHVV", "type": "application/json" } }, "meta": { "createdByUser": { "id": 17, "username": "noksagt", "name": "", "links": { "alternate": { "href": "https://www.zotero.org/noksagt", "type": "text/html" } } } }, "data": { "key": "SAQNNDRG", "version": 5, "parentItem": "KFKKDHVV", "itemType": "attachment", "linkMode": "linked_url", "title": "Amazon.com Link", "accessDate": "2014-03-03T18:59:07Z", "url": "http://www.amazon.com/Microscopy-Springer-Series-Materials-Science/dp/1461434351/ref=pd_sim_b_1?ie=UTF8&refRID=11M1FCMWSSR4RHDYCG0Y", "note": "", "contentType": "text/html", "charset": "", "tags": [], "relations": {}, "dateAdded": "2014-03-03T18:59:07Z", "dateModified": "2014-03-03T18:59:07Z" } }, { "key": "KFKKDHVV", "version": 5, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/KFKKDHVV", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/KFKKDHVV", "type": "text/html" } }, "meta": { "createdByUser": { "id": 17, "username": "noksagt", "name": "", "links": { "alternate": { "href": "https://www.zotero.org/noksagt", "type": "text/html" } } }, "creatorSummary": "Gault", "parsedDate": "2012", "numChildren": 1 }, "data": { "key": "KFKKDHVV", "version": 5, "itemType": "book", "title": "Atom probe microscopy", "creators": [ { "creatorType": "author", "firstName": "Baptiste", "lastName": "Gault" } ], "abstractNote": "Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy--including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Provides the most practical, up-to-date and critical review of atom probe microscopy techniquesPresents a detailed description of the analysis tools Includes practical examples of how the technique can be used in materials science research Stands as a must-have reference for any user of atom probe microscopy.", "series": "", "seriesNumber": "", "volume": "", "numberOfVolumes": "", "edition": "", "date": "2012", "publisher": "Springer", "place": "New York", "originalDate": "", "originalPublisher": "", "originalPlace": "", "format": "", "numPages": "", "ISBN": "9781461434368 146143436X", "DOI": "", "citationKey": "", "url": "", "accessDate": "", "ISSN": "", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "English", "libraryCatalog": "Open WorldCat", "callNumber": "", "rights": "", "extra": "", "tags": [], "collections": [ "VI2PTZ9H" ], "relations": {}, "dateAdded": "2014-03-03T18:59:07Z", "dateModified": "2014-03-03T18:59:07Z" } }, { "key": "5Q2KXJ5N", "version": 4, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/5Q2KXJ5N", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/5Q2KXJ5N", "type": "text/html" } }, "meta": { "createdByUser": { "id": 17, "username": "noksagt", "name": "", "links": { "alternate": { "href": "https://www.zotero.org/noksagt", "type": "text/html" } } }, "creatorSummary": "Larson et al.", "parsedDate": "2013-12-27", "numChildren": 1 }, "data": { "key": "5Q2KXJ5N", "version": 4, "itemType": "book", "title": "Local Electrode Atom Probe Tomography: A User's Guide", "creators": [ { "creatorType": "author", "firstName": "David J.", "lastName": "Larson" }, { "creatorType": "author", "firstName": "Ty J.", "lastName": "Prosa" }, { "creatorType": "author", "firstName": "Robert M.", "lastName": "Ulfig" }, { "creatorType": "author", "firstName": "Brian P.", "lastName": "Geiser" }, { "creatorType": "author", "firstName": "Thomas F.", "lastName": "Kelly" }, { "creatorType": "author", "firstName": "Professor Sir Colin J.", "lastName": "Humphreys" }, { "creatorType": "author", "firstName": "", "lastName": "146148720X" }, { "creatorType": "author", "firstName": "", "lastName": "978-1461487203" } ], "abstractNote": "", "series": "", "seriesNumber": "", "volume": "", "numberOfVolumes": "", "edition": "", "date": "December 27, 2013", "publisher": "Springer", "place": "New York", "originalDate": "", "originalPublisher": "", "originalPlace": "", "format": "", "numPages": "318", "ISBN": "146148720X", "DOI": "", "citationKey": "", "url": "", "accessDate": "", "ISSN": "", "archive": "", "archiveLocation": "", "shortTitle": "Local Electrode Atom Probe Tomography", "language": "English", "libraryCatalog": "Amazon.com", "callNumber": "", "rights": "", "extra": "", 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"Amazon.com Link", "accessDate": "2014-03-03T18:56:07Z", "url": "http://www.amazon.com/Local-Electrode-Atom-Probe-Tomography/dp/146148720X/ref=sr_1_1?ie=UTF8&qid=1393872690&sr=8-1&keywords=local+electrode+atom+probe+tomography", "note": "", "contentType": "text/html", "charset": "", "tags": [], "relations": {}, "dateAdded": "2014-03-03T18:56:07Z", "dateModified": "2014-03-03T18:56:07Z" } }, { "key": "PTT95BWA", "version": 1, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/PTT95BWA", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/PTT95BWA", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Karnesky et al.", "parsedDate": "2009", "numChildren": 0 }, "data": { "key": "PTT95BWA", "version": 1, "itemType": "journalArticle", "title": "Evolution of Nanoscale Precipitates in Al Microalloyed with Sc and Er", "creators": [ { "creatorType": "author", "firstName": "Richard A.", "lastName": "Karnesky" }, { "creatorType": "author", "firstName": "David C.", "lastName": "Dunand" }, { "creatorType": "author", "firstName": "David N.", "lastName": "Seidman" } ], "abstractNote": "The coarsening kinetics of nanoscale, coherent Al₃(Sc₁₋[sub:x]Er[sub:x]) precipitates in α–Al during aging of a supersaturated Al–0.06 Sc–0.02 Er (at.%) alloy at 300 °C are studied using transmission electron microscopy and local-electrode atom-probe tomography. Erbium and Sc segregate at the precipitate core and shell, respectively. The matrix supersaturations of Er and Sc, as well as the mean precipitate radius and number density evolve in approximate agreement with coarsening models, allowing the determination of the matrix/precipitate interfacial free energy and solute diffusivities. At 300 °C, the α–Al/Al₃(Sc₁₋[sub:x]Er[sub:x]) interfacial free energy due to Sc is about twice as large as for α–Al/Al₃Sc. The diffusivity of Er in the ternary alloy is about three orders of magnitude smaller than that of Er in binary Al–0.045 at.% Er and about two orders of magnitude smaller than the diffusivity of Sc in binary Al–Sc. The measured Sc diffusivity is consistent with literature values.", "publicationTitle": "Acta Materialia", "publisher": "", "place": "", "date": "2009", "volume": "In Press", "issue": "", "section": "", "partNumber": "", "partTitle": "", "pages": "", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "Acta Mater.", "DOI": "", "citationKey": "", "url": "http://arc.nucapt.northwestern.edu/refbase/show.php?record=10599", "accessDate": "", "PMID": "", "PMCID": "", "ISSN": "1359-6454", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "", "callNumber": "", "rights": "", "extra": "", "tags": [ { "tag": "Al-Sc-Er", "type": 1 }, { "tag": "Aluminum alloys", "type": 1 }, { "tag": "Coarsening", "type": 1 }, { "tag": "Precipitation", "type": 1 }, { "tag": "Rare-Earth Elements", "type": 1 }, { "tag": "Scandium", "type": 1 } ], "collections": [], "relations": {}, "dateAdded": "2009-05-17T15:25:28Z", "dateModified": "2009-05-17T15:25:28Z" } }, { "key": "PAVTZAWZ", "version": 1, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/PAVTZAWZ", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/PAVTZAWZ", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "van Dalen et al.", "parsedDate": "2009", "numChildren": 0 }, "data": { "key": "PAVTZAWZ", "version": 1, "itemType": "journalArticle", "title": "Erbium and Ytterbium Solubilities and Diffusivities in Aluminum as Determined by Nanoscale Characterization of Precipitates", "creators": [ { "creatorType": "author", "firstName": "Marsha E.", "lastName": "van Dalen" }, { "creatorType": "author", "firstName": "Richard A.", "lastName": "Karnesky" }, { "creatorType": "author", "firstName": "Josep R.", "lastName": "Cabotaje" }, { "creatorType": "author", "firstName": "David C.", "lastName": "Dunand" }, { "creatorType": "author", "firstName": "David N.", "lastName": "Seidman" } ], "abstractNote": "Binary aluminum alloys with 0.03-0.06 at.% RE (RE = Yb or Er) were aged to produce coherent, nanosize Al₃RE precipitates in an α-Al matrix. The temporal evolution of precipitate radii and matrix concentrations at 300 °C are measured by transmission electron microscopy and localelectrode atom-probe tomography, respectively. The temporal dependence of the matrix concentration of each RE is utilized to determine its solubility in Al. The solubility as well as the coarsening rate constants are used to determine the diffusivity of each RE in α-Al and the α-Al/Al₃RE interfacial free energies at 300 °C. When compared to Sc, both Yb and Er exhibit smaller solubilities but larger diffusivities in α-Al and larger α-Al/Al₃RE interfacial energies.", "publicationTitle": "Acta Materialia", "publisher": "", "place": "", "date": "2009", "volume": "In Press", "issue": "", "section": "", "partNumber": "", "partTitle": "", "pages": "", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "Acta Mater.", "DOI": "", "citationKey": "", "url": "http://arc.nucapt.northwestern.edu/refbase/show.php?record=10598", "accessDate": "", "PMID": "", "PMCID": "", "ISSN": "1359-6454", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "", "callNumber": "", "rights": "", "extra": "", "tags": [ { "tag": "Al-Er", "type": 1 }, { "tag": "Al-Yb", "type": 1 }, { "tag": "Aluminum alloys", "type": 1 }, { "tag": "Coarsening", "type": 1 }, { "tag": "Diffusion", "type": 1 }, { "tag": "Precipitation", "type": 1 }, { "tag": "Rare-Earth Elements", "type": 1 } ], "collections": [], "relations": {}, "dateAdded": "2009-05-17T15:25:28Z", "dateModified": "2009-05-17T15:25:28Z" } }, { "key": "3BUNVAXR", "version": 1, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/3BUNVAXR", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/3BUNVAXR", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Karnesky", "parsedDate": "2007", "numChildren": 0 }, "data": { "key": "3BUNVAXR", "version": 1, "itemType": "thesis", "title": "Mechanical Properties and Microstructure of Al–Sc with Rare-Earth Element or Al₂O₃ Additions", "creators": [ { "creatorType": "author", "firstName": "Richard A.", "lastName": "Karnesky" } ], "abstractNote": "Aluminum alloys strengthened with coherent (L1₂), nanosize Al₃Sc precipitates are structural materials that have outstanding strength at ambient and elevated temperatures. They are creep resistant at 300 °C and exhibit a threshold stress, below which creep is not measurable. Introducing ternary alloying additions, such as rare-earth elements (RE=Y, Dy, Er), that segregate within Al₃Sc precipitates improves this creep resistance by increasing the lattice parameter misfit of precipitates with Al. In this thesis, Al–600 Sc–200 RE and Al–900 Sc–300 Er (at. ppm) are studied. These elements are an order of magnitude less expensive than Sc, so reduce alloy costs. As an alternative or supplement to ternary additions, submicron (incoherent) Al₂O₃ dispersoids impart additional strengthening. The dispersion-strengthened cast alloys, DSC–Al–1100 Sc and DSC–Al–800 Sc–300 Zr, studied in this thesis contain 30 vol.% Al₂O₃.\n\nIn this thesis, the temporal evolution of Al–Sc–RE and DSC–Al–Sc(–Zr) alloys are measured using Local-Electrode Atom-Probe (LEAP) tomography, conventional transmission electron microscopy, and electrical conductivity. These techniques measure the changes in precipitate number density, size, volume fraction, chemical composition, and interprecipitate distance and are compared to models. They are also employed to measure the diffusivity and solid solubility of Er in Al in Al–300 Er, Al–450 Er, and Al–600 Er.\n\nThe mechanical behavior (microhardness, yield, and creep) of the alloys is studied at 25, 300, and 350 °C. The effect of Al₃(Sc₁₋[sub:x]Er[sub:x]) precipitate size and interprecipitate distance is studied by varying isochronal and isothermal aging treatments. Various models and simulations are compared to experimental data. At ambient temperatures, very small Al₃(Sc₁₋[sub:x]M[sub:x]) precipitates contribute to order strengthening and larger (unshearable) precipitates are bypassed by dislocations through Orowan bowing. Dislocation dynamics simulations allow both processes to operate in a glide plane, where precipitate distributions may be gathered directly or be informed by LEAP tomography data. At elevated temperatures, the lattice parameter and modulus mismatches of Al₃(Sc₁₋[sub:x]M[sub:x]) oppose both dislocation climb over Al₃(Sc₁₋[sub:x]M[sub:x]) and dislocation detachment from Al₂O₃.", "thesisType": "", "university": "Northwestern University", "place": "", "date": "2007", "series": "", "seriesNumber": "", "numPages": "", "DOI": "", "ISBN": "", "citationKey": "", "url": "http://arc.nucapt.northwestern.edu/refbase/show.php?record=10000", "accessDate": "", "ISSN": "", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "", "callNumber": "", "rights": "", "extra": "", "tags": [], "collections": [], "relations": {}, "dateAdded": "2009-05-17T15:25:28Z", "dateModified": "2009-05-17T15:25:28Z" } }, { "key": "9CJJJEF3", "version": 1, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/9CJJJEF3", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/9CJJJEF3", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Karnesky et al.", "parsedDate": "2007", "numChildren": 0 }, "data": { "key": "9CJJJEF3", "version": 1, "itemType": "journalArticle", "title": "Direct Measurement of 2-Dimensional and 3-Dimensional Interprecipitate Distance Distributions from Atom-Probe Tomographic Reconstructions", "creators": [ { "creatorType": "author", "firstName": "Richard A.", "lastName": "Karnesky" }, { "creatorType": "author", "firstName": "Dieter", "lastName": "Isheim" }, { "creatorType": "author", "firstName": "David N.", "lastName": "Seidman" } ], "abstractNote": "Edge-to-edge interprecipitate distance distributions are critical for predicting precipitation strengthening of alloys and other physical phenomena. A method to calculate this 3-Dimensional distance and the 2-Dimensional interplanar distance from atom-probe tomographic data is presented. It is applied to nanometer-sized Cu-rich precipitates in an Fe-1.7 at.% Cu alloy. Experimental interprecipitate distance distributions are discussed.", "publicationTitle": "Applied Physics Letters", "publisher": "", "place": "", "date": "2007", "volume": "91", "issue": "1", "section": "", "partNumber": "", "partTitle": "", "pages": "013111:1-3", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "Appl. Phys. Lett.", "DOI": "10.1063/1.2753097", "citationKey": "", "url": "http://arc.nucapt.northwestern.edu/refbase/show.php?record=1911", "accessDate": "", "PMID": "", "PMCID": "", "ISSN": "0003-6951", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "", "callNumber": "", "rights": "", "extra": "", "tags": [ { "tag": "Atom-probe tomography", "type": 1 }, { "tag": "Ferritic steels", "type": 1 }, { "tag": "Interprecipitate distance distributions", "type": 1 }, { "tag": "Precipitation", "type": 1 } ], "collections": [], "relations": {}, "dateAdded": "2009-05-17T15:25:28Z", "dateModified": "2009-05-17T15:25:28Z" } }, { "key": "4ECTDNS5", "version": 1, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/4ECTDNS5", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/4ECTDNS5", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Karnesky et al.", "parsedDate": "2007", "numChildren": 0 }, "data": { "key": "4ECTDNS5", "version": 1, "itemType": "journalArticle", "title": "Best-Fit Ellipsoids of Atom-Probe Tomographic Data to Study Coalescence of γ' (L1₂) Precipitates in Ni-Al-Cr", "creators": [ { "creatorType": "author", "firstName": "Richard A.", "lastName": "Karnesky" }, { "creatorType": "author", "firstName": "Chantal K.", "lastName": "Sudbrack" }, { "creatorType": "author", "firstName": "David N.", "lastName": "Seidman" } ], "abstractNote": "An algorithm is presented to fit precipitates in atom probe tomographic data sets as equivalent ellipsoids. Unlike previous techniques, which measure only the radius of gyration, these ellipsoids retain the moments of inertia and principle axes of the original precipitate, preserving crystallographic orientational\ninformation. The algorithm is applied to study interconnected γ'-precipitates (L1₂) in the γ-matrix (FCC) of a Ni-Al-Cr alloy. The precipitates are found to coagulate along <110>-type directions.", "publicationTitle": "Scripta Materialia", "publisher": "", "place": "", "date": "2007", "volume": "57", "issue": "4", "section": "", "partNumber": "", "partTitle": "", "pages": "353-356", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "Scripta Mater.", "DOI": "10.1016/j.scriptamat.2007.04.020", "citationKey": "", "url": "http://arc.nucapt.northwestern.edu/refbase/show.php?record=9601", "accessDate": "", "PMID": "", "PMCID": "", "ISSN": "1359-6462", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "", "callNumber": "", "rights": "", "extra": "", "tags": [ { "tag": "Atom-probe tomography", "type": 1 }, { "tag": "Best-fit ellipsoid", "type": 1 }, { "tag": "Coarsening", "type": 1 }, { "tag": "Nickel alloys", "type": 1 } ], "collections": [], "relations": {}, "dateAdded": "2009-05-17T15:25:28Z", "dateModified": "2009-05-17T15:25:28Z" } }, { "key": "3RTZZV75", "version": 1, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/3RTZZV75", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/3RTZZV75", "type": "text/html" } }, "meta": { "createdByUser": { "id": 24202, "username": "karnesky", "name": "Richard Karnesky", "links": { "alternate": { "href": "https://www.zotero.org/karnesky", "type": "text/html" } } }, "creatorSummary": "Karnesky et al.", "parsedDate": "2006", "numChildren": 0 }, "data": { "key": "3RTZZV75", "version": 1, "itemType": "journalArticle", "title": "Effects of Substituting Rare-Earth Elements for Scandium in a Precipitation-Strengthened Al 0.08 at.% Sc Alloy", "creators": [ { "creatorType": "author", "firstName": "Richard A.", "lastName": "Karnesky" }, { "creatorType": "author", "firstName": "Marsha E.", "lastName": "van Dalen" }, { "creatorType": "author", "firstName": "David C.", "lastName": "Dunand" }, { "creatorType": "author", "firstName": "David N.", "lastName": "Seidman" } ], "abstractNote": "The microhardness of Al-0.06 Sc-0.02 RE (at.%, with RE = Dy, Er, Gd, Sm, Y, or Yb) alloys is measured as a function of aging time at 300C. As compared to Al-0.08 Sc, the ternary alloys exhibit: (i) the same incubation time, except for Al-0.06 Sc-0.02 Yb which hardens much faster; (ii) the same or reduced peak microhardnesses (which are higher than for Al-0.06 Sc) and (iii) the same overaging behavior. All RE segregate to the core of Al₃(Sc₁₋[sub:x]RE[sub:x]) precipitates.", "publicationTitle": "Scripta Materialia", "publisher": "", "place": "", "date": "2006", "volume": "55", "issue": "5", "section": "", "partNumber": "", "partTitle": "", "pages": "437-440", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "Scripta Mater.", "DOI": "10.1016/j.scriptamat.2006.05.021", "citationKey": "", "url": "http://arc.nucapt.northwestern.edu/refbase/show.php?record=779", "accessDate": "", "PMID": "", "PMCID": "", "ISSN": "1359-6462", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "", "callNumber": "", "rights": "", "extra": "", "tags": [ { "tag": "Al-Sc", "type": 1 }, { "tag": "Aluminum alloys", "type": 1 }, { "tag": "LEAP", "type": 1 }, { "tag": "Lanthanides", "type": 1 }, { "tag": "Local-Electrode Atom-Probe tomography", "type": 1 }, { "tag": "Precipitation strengthening", "type": 1 }, { "tag": "Rare-Earth Elements", "type": 1 }, { "tag": "Scandium", "type": 1 } ], "collections": [], "relations": {}, "dateAdded": "2009-05-17T15:24:29Z", "dateModified": "2009-05-17T15:24:29Z" } }, { "key": "A565G8IM", "version": 1, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/A565G8IM", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/A565G8IM", "type": "text/html" } }, "meta": { "createdByUser": { "id": 17, "username": "noksagt", "name": "", "links": { "alternate": { "href": "https://www.zotero.org/noksagt", "type": "text/html" } } }, "creatorSummary": "Zhang", "parsedDate": "2008", "numChildren": 0 }, "data": { "key": "A565G8IM", "version": 1, "itemType": "journalArticle", "title": "Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic Resolution", "creators": [ { "creatorType": "author", "firstName": "X. F.", "lastName": "Zhang" } ], "abstractNote": "Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008", "publicationTitle": "Microscopy and Microanalysis", "publisher": "", "place": "", "date": "2008", "volume": "14", "issue": "SupplementS2", "section": "", "partNumber": "", "partTitle": "", "pages": "790-791", "series": "", "seriesTitle": "", "seriesText": "", "journalAbbreviation": "", "DOI": "", "citationKey": "", "url": "http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=1942608&fulltextType=SU&fileId=S1431927608081154", "accessDate": "", "PMID": "", "PMCID": "", "ISSN": "", "archive": "", "archiveLocation": "", "shortTitle": "", "language": "", "libraryCatalog": "", "callNumber": "", "rights": "", "extra": "", "tags": [], "collections": [], "relations": {}, "dateAdded": "2009-05-15T05:45:36Z", "dateModified": "2009-05-15T05:45:36Z" } }, { "key": "V8MXEMG6", "version": 1, "library": { "type": "group", "id": 11, "name": "Atom-Probe Tomography", "links": { "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography", "type": "text/html" } } }, "links": { "self": { "href": "https://api.zotero.org/groups/11/items/V8MXEMG6", "type": "application/json" }, "alternate": { "href": "https://www.zotero.org/groups/atom-probe_tomography/items/V8MXEMG6", "type": "text/html" } }, "meta": { "createdByUser": { "id": 17, "username": "noksagt", "name": "", "links": { "alternate": { "href": "https://www.zotero.org/noksagt", "type": "text/html" } } }, "creatorSummary": "Ulfig et al.", "parsedDate": "2008", "numChildren": 0 }, "data": { "key": "V8MXEMG6", "version": 1, "itemType": "journalArticle", "title": "Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography", "creators": [ { "creatorType": "author", "firstName": "R. 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